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| Raw Silk Quality Index Comparison between Electronic Tester and Seriplane Test System |
| College of Textile and Clothing Engineering, Soochow University, Suzhou, Jiangsu 215021, China National Engineering Laboratory for Modern Silk, Soochow University Suzhou, Jiangsu 215021, China Zhejiang Silk Science & Technology Co. Ltd., Hangzhou 310011, China Zhejiang Entry-Exit Inspection & Quarantine Bureau, Hangzhou 310011, China Centro Tessile Serico, Como 322100, Italia |
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Abstract A new electronic tester consisting of capacitive sensors and optical sensors is now introduced into raw silk
inspection. Compared with the traditional seriplane test, the quality indices change a lot. In assessing
the yarn evenness, the electronic tester measures the coe±cient of variation of the raw silk size (CVeven%,
CV5 m%, CV50 m%), while the seriplane uses evenness II. In assessing the yarn defects, the electronic
tester measures the slubs, thick places and thin places, SIE (small imperfection element), while the
seriplane test uses cleanness and neatness. However, raw silk users who have been used to the seriplane
test report want to know how to interpret the electronic test indices, they want to be convinced by
knowing the correlation between the indices of the two test systems. In this study 50 lots of raw silk are
sampled and tested by the two test systems, and the correlation coe±cients of the corresponding indices
are computed and analyzed. The result shows that there are significant correlation between evenness II
and CV5 m%, a strong correlation between cleanness and slub by the optical sensor, a strong correlation
between neatness and SIE by both the capacitive and the optical sensor, and a strong correlation between
neatness and the thick and thin places by optical sensor. The result confirms the substitution of the
electronic test for seriplane test in future from the technical viewpoint.
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| Fund:
This work was imbursed by National Natural Science Foundation of China (51303117), and the
Priority Academic Program Development of Jiangsu Higher Education Institutions.
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| Cite this article: |
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Jianmei Xu,Dongping Wu,Ying Zhou, et al. Raw Silk Quality Index Comparison between Electronic Tester and Seriplane Test System[J]. Journal of Fiber Bioengineering and Informatics, 2014, 7(3): 339-348.
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2014, Vol. 7 
